Mitsuo Takeda is Professor of Opto-electronics, at UEC Tokyo (the University of Electro-Communications), Japan. He received the BS degree in electrical engineering from UEC in 1969, and the MS and the PhD degrees in applied physics from the University of Tokyo, in 1971 and 1974, respectively. After working for Canon Inc., he joined the faculty of UEC in 1977. During 1985 he was a visiting scholar in Prof. J. W. Goodman's Group at Stanford University. He served on the Board of Directors of the Japan Society of Applied Physics (JSAP, 1993-1995) and SPIE (2007-2009), and he is presently President of the Optical Society of Japan, JSAP. He is a Fellow of SPIE, OSA and JSAP, a member of the International Order of the Knights of Holography, and a recipient of 2010 SPIE Dennis Gabor Award.
“Fourier fringe analysis applied for unconventional scientific and industrial metrologies of extreme physical phenomena: A Review”
Phase measurement plays a crucial role in optical science and technology. A technique for fringe analysis, now known by the name of the Fourier transform method (FTM), or Fourier fringe analysis, was proposed and experimentally demonstrated in 1982. Since then, through three decades of active participation of many scientists and engineers, FTM has been critically analyzed, continuously improved, and has created new areas of cross-disciplinary applications beyond its early applications to optical interferometry and profilometry. The purpose of this talk is to give an overview of FTM with a particular focus on its scientific and industrial applications to the measurements of extreme physical phenomena, such as those involving ultra fast optical pulses, extremely small atomic displacements, and unconventional electron wave, X-ray and EUV interferometry, and shows how the advantages of FTM are exploited in these cutting edge application areas.