Osten received the BSc from the University of Jena in 1979.
From 1979 to 1984 he was a member of the Institute of Mechanics
in Berlin working in the field of experimental stress analysis
and optical metrology. In 1983 he received the PhD degree
from the Martin-Luther-University Halle-Wittenberg for his
thesis in the field of holographic interferometry. From 1984
to 1991 he was employed at the Central Institute of Cybernetics
and Information Processes in Berlin making investigations
in digital image processing and computer vision. In 1991,
he joins the Bremen Institute of Applied Beam Technology (BIAS)
to establish and to direct the Department Optical 3D-Metrology
till 2002. Since September 2002 he has been a full professor
at the University of Stuttgart and director of the Institute
for Applied Optics. Currently he is vice-rector for research
and technology of the Stuttgart University. His research work
is focused on new concepts for industrial inspection and metrology
by combining modern principles of optical metrology, sensor
technology and image processing. Special attention is paid
to the development of resolution enhanced technologies for
the investigation of micro and nano structures.
“How to bring your laboratory in the cloud?
(Or: About the future of remote metrology)”
The idea of remote and virtual metrology has been reported already in 2000 with a conceptual illustration by use of comparative digital holography, aimed at the comparison of two nominally identical but physically different objects, e.g., master and sample, in industrial inspection processes. However, the concept of remote and virtual metrology can be extended far beyond this. For example, it does not only allow for the transmission of static holograms over the Internet, but also provides an opportunity to communicate with and eventually control the physical set-up of a remote metrology system. Furthermore, the metrology system can be modeled in the environment of a 3D virtual reality using CAD or similar technology, providing a more intuitive interface to the physical setup within the virtual world. An engineer or scientist who would like to access the remote real world system can log on to the virtual system, moving and manipulating the setup through an avatar and take the desired measurements. The real metrology system responds to the interaction between the avatar and the 3D virtual representation, providing a more intuitive interface to the physical setup within the virtual world. The measurement data is stored and interpreted automatically for appropriate display within the virtual world, providing the necessary feedback to the experimenter. Such a system open up many novel opportunities in industrial inspection such as virtual remote metrology and inspection. Moreover, a bunch of new approaches for modern documenting, reviewing and publishing experimental results, for teaching, for sharing expensive and complex facilities, for international cooperation, for testing new devices, for maintanance and service, and many more. The paper describes the idea of remote laboratories and illustrates the potential of the approach on selected examples.